Desired wave to interference wave power ratio measurement circuit and desired wave to interference wave power ratio measurement method

摘要

A bias error in a low SIR area is corrected by subtracting a value of an interference signal power multiplied by a first correction coefficient which has been determined from an SIR characteristic diagram obtained in advance from a desired signal power to remove an interference signal component included in the desired signal power. Also, a bias error in a high SIR area is corrected by subtracting a value of a desired signal power multiplied by a second correction coefficient which has been determined from the SIR characteristic diagram obtained in advance from an interference signal power to remove a desired signal component included in the interference signal power. IMAGE