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The bolometer material, production method of the bolometer thin film and the bolometer thin film, and the infrared ray inspection element which uses that

机译:辐射热计材料,辐射热计薄膜和辐射热计薄膜的制造方法以及使用其的红外线检查元件

摘要

Temperature coefficient of resistance (|TCR|) The high rag meter thin film is formed with simple manufacturing process, the infrared ray inspection element of high sensitivity is offered.As for this invention, past compared to temperature coefficient of resistance (|TCR|) High Z yCuO x (in formula, Z, one kind or two kinds or more of alkaline earths metal, one kind or two kinds or more of rare earth element which is chosen from the yttrium or lanthanides element, the periodic table which is chosen from the bismuth, the lead, thallium, the mercury or cadmium 5th or displays or more of element of 6th period, or the kalium or the sodium either one kind or two kinds, y displays the quantity of 0y2, x displays the quantity of 0.5yx1.5+2y.)So the rag meter which uses the thin film of the oxide which is displayed is offered. This is produced by forming the rag meter thin film the blend of the oxide of Cu such as the blend of Cu2 O or CuO or Cu2 O and CuO and the oxide of the above-mentioned various elements which are displayed with Z, or those compound oxides as a target, with sputtering.
机译:电阻温度系数(| TCR |)高电阻计薄膜通过简单的制造工艺形成,提供了高灵敏度的红外线检查元件。与电阻温度系数(| TCR |)相比,本发明是过去的。高Z yCuO x (式中,Z为一种或两种以上的碱土金属,一种选自钇或镧系元素的稀土元素,一种或两种以上,从铋,铅,th,汞或镉中选出的元素周期表中的第5个或第6个时期或以上的元素,或钾或钠中的一种或两种,y表示的量为0y2, x显示量为0.5y 2 O或CuO或Cu 2 O和CuO的混合物)与氧化物形成的通过溅射以Z或那些复合氧化物为靶的上述各种元素中的一种。

著录项

  • 公开/公告号JPWO2002039508A1

    专利类型

  • 公开/公告日2004-03-18

    原文格式PDF

  • 申请/专利权人 三菱電機株式会社;

    申请/专利号JP20020541727

  • 发明设计人 宮下 章志;樋熊 弘子;

    申请日2001-08-13

  • 分类号H01L37/00;G01J1/02;

  • 国家 JP

  • 入库时间 2022-08-21 23:25:24

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