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Position detection method, position detecting apparatus, exposure method, exposure apparatus, control program, and device manufacturing method

机译:位置检测方法,位置检测设备,曝光方法,曝光设备,控制程序和装置制造方法

摘要

Based on the observations of the object obtained by the observation device, the coincidence degree calculation device, while moving the plurality of regions with a mutual positional relationship between the predetermined observation coordinate system of the object, the observation in the area each of the plurality in at least for observation of the pair, and calculates the degree of coincidence between areas considering the regions between symmetry predetermined (step 151-160). The position information calculating device obtains the relationship between the area between the degree of coincidence between the moving position of the observation coordinate system of a plurality of regions, the observation of a plurality of regions on the basis of the relationship, for example between the regions matching degree is maximum By determining the position of the coordinate system, to determine the position information of the object (step 161). As a result, it is possible to detect the position information of the object with high accuracy.
机译:基于由观察装置,重合度计算装置获得的对物体的观察,同时在物体的预定观察坐标系之间以相互的位置关系移动多个区域的同时,在多个区域中的每个区域中进行观察。至少用于观察该对,并且考虑到预定的对称性之间的区域来计算区域之间的一致程度(步骤151-160)。位置信息计算装置获得多个区域的观察坐标系的移动位置之间的重合度之间的区域之间的关系,基于该关系例如多个区域之间的观察多个区域的区域之间的关系。通过确定坐标系的位置,来确定物体的位置信息(步骤161)。结果,可以高精度地检测物体的位置信息。

著录项

  • 公开/公告号JPWO2002033351A1

    专利类型

  • 公开/公告日2004-02-26

    原文格式PDF

  • 申请/专利权人 株式会社ニコン;

    申请/专利号JP20020536494

  • 发明设计人 中島 伸一;

    申请日2001-10-19

  • 分类号G01B11/00;G03F9/00;H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-21 23:24:27

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