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PROCESSING APPARATUS HAVING AT LEAST TWO SPATIAL UNITS, IN WHICH DENSITY OF CONTAMINATED PARTICLE IS RESPECTIVELY REDUCED AS COMPARED WITH AMBIENTS
PROCESSING APPARATUS HAVING AT LEAST TWO SPATIAL UNITS, IN WHICH DENSITY OF CONTAMINATED PARTICLE IS RESPECTIVELY REDUCED AS COMPARED WITH AMBIENTS
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机译:具有至少两个空间单位的处理设备,其被污染粒子的密度与环境相比分别降低了
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摘要
PROBLEM TO BE SOLVED: To provide an arrangement wherein the density of contaminated particles is reduced so as to be smaller in a spatial unit, more sensitive in relation to the contaminated particles between two sets of the spatial unit in a processing apparatus for manufacturing a semiconductor.;SOLUTION: The first spatial unit 21 and the second spatial unit 22, in which the density of contaminated particles is reduced compared with the ambients thereof, respectively, are provided while a first laminar flow 41 having a first flow rate and a second laminar flow 42 having a second flow rate are parallel in relation to each other. The first spatial unit 21 is connected to the second spatial unit 22 by a third spatial unit 23 so as to transport a semiconductor disk while a third laminar flow 43 having a third flow rate is orthogonal to the first laminar flow 41 and the second laminar flow 42.;COPYRIGHT: (C)2004,JPO
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