首页> 外国专利> Correction coefficient calculating method for X-ray CT systems, beam hardening post-processing method therefor, and X-ray CT system

Correction coefficient calculating method for X-ray CT systems, beam hardening post-processing method therefor, and X-ray CT system

机译:X射线CT系统的校正系数计算方法,其束硬化后处理方法以及X射线CT系统

摘要

An object of the present invention is to calculate a more accurate beam-hardening correction coefficient. A phantom having an oblong section or a phantom having an annular (sector) section and a uniform thickness is positioned in an X-ray CT system, and scanned from plural directions in order to acquire a plurality of views. The results of the scan are used to calculate a correction coefficient that is used to correct projection information to be acquired from a subject.
机译:本发明的目的是计算更准确的射束硬化校正系数。在X射线CT系统中定位具有椭圆形截面的体模或具有环形(扇形)截面并具有均匀厚度的体模,并从多个方向进行扫描以获取多个视图。扫描的结果用于计算校正系数,该校正系数用于校正要从被摄体获取的投影信息。

著录项

  • 公开/公告号US2004196960A1

    专利类型

  • 公开/公告日2004-10-07

    原文格式PDF

  • 申请/专利权人 TANIGAWA SHUNICHIRO;NUKUI MASATAKE;

    申请/专利号US20040816626

  • 发明设计人 SHUNICHIRO TANIGAWA;MASATAKE NUKUI;

    申请日2004-04-02

  • 分类号G21K1/12;H05G1/60;A61B6/00;G01N23/00;G01D18/00;

  • 国家 US

  • 入库时间 2022-08-21 23:20:00

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