Automatic gain control (AGC) loop for characterizing continuous-time or discrete-time circuitry gain response across frequency

摘要

The present invention is a method, system, and product for testing operating characteristics of a continuous-time or discrete-time device under test, which is included within a circuit. The operating characteristics of the continuous-time or discrete-time device are tested utilizing electronic components that already exist within the circuit such that a test circuit is not utilized to test the device. The circuit includes a variable gain amplifier and an automatic gain correction (AGC) circuit. The operating characteristics of the device are tested utilizing the variable gain amplifier and said AGC circuit.