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Test method for guaranteeing full stuck-at-fault coverage of a memory array
Test method for guaranteeing full stuck-at-fault coverage of a memory array
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机译:确保内存阵列完全卡住故障的测试方法
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摘要
A method, computer program product and system for testing stuck-at-faults. A first register may be loaded with a first value where the first value may be written into each entry in a memory array. A second register may be loaded with a second value. A third register may be loaded with either the second value or a third value. The second and third values are pre-selected to test selector circuits for stuck-at-faults with a pattern where the pattern includes a set of bits to be inputted to selector circuits and a set of bits to be stored in the memory cells. A value stored in the n-most significant bits in both the second and third registers may be predecoded to produce a predecode value. The predecode value may be compared with the value stored in the n-most significant bits in an entry in the memory array to determine a stuck-at-fault.
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