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MOS semiconductor device having inactive zone with alternating thickness silicon oxide layer located between a semiconductor region and a conductive layer

机译:具有不活动区的MOS半导体器件,该不活动区具有位于半导体区域和导电层之间的交替厚度的氧化硅层

摘要

A MOS semiconductor device formed on a substrate of a first conductivity type is provided. The device includes active zones for elementary active elements, and at least one inactive zone suitable for electric signal input or output. The substrate is connected with the drain terminal of the device, and at least one of the elementary active elements includes a body region of a second conductivity type that is connected with the source terminal of the device. The at least one inactive zone includes a semiconductor region of the second conductivity type formed in the substrate and adjacent a surface of the substrate, a conductive layer located over the semiconductor region, and a silicon oxide layer located between the semiconductor region and the conductive layer. The silicon oxide layer has alternating first zones and second zones that are contiguous to each other, with the first zones having a greater thickness than the second zones.
机译:提供了一种在第一导电类型的基板上形成的MOS半导体器件。该装置包括用于基本有源元件的有源区域,以及至少一个适合于电信号输入或输出的非有源区域。所述基板与所述装置的漏极端子连接,并且所述基本有源元件中的至少一个包括与所述装置的源极端子连接的第二导电类型的主体区域。所述至少一个非活性区包括:第二导电类型的半导体区域,其形成在所述基板中并邻近所述基板的表面;导电层,其位于所述半导体区域上方;以及氧化硅层,其位于所述半导体区和所述导电层之间。 。氧化硅层具有交替的彼此相邻的第一区域和第二区域,其中第一区域的厚度大于第二区域的厚度。

著录项

  • 公开/公告号US6750512B2

    专利类型

  • 公开/公告日2004-06-15

    原文格式PDF

  • 申请/专利权人 STMICROELECTRONICS S.R.L.;

    申请/专利号US20020251907

  • 发明设计人 PAOLA MARIA PONZIO;ANTONINO SCHILLACI;

    申请日2002-09-20

  • 分类号H01L297/60;H01L299/40;H01L310/62;H01L311/13;H01L311/19;

  • 国家 US

  • 入库时间 2022-08-21 23:18:41

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