首页> 外国专利> Non-volatile memory transistor array implementing amp;ldquo;Hamp;rdquo; shaped source/drain regions and method for fabricating same

Non-volatile memory transistor array implementing amp;ldquo;Hamp;rdquo; shaped source/drain regions and method for fabricating same

机译:实现“ H”的非易失性存储晶体管阵列成形的源/漏区及其制造方法

摘要

A non-volatile memory (NVM) array including a plurality of 2-bit NVM transistors arranged in a plurality of rows extending along a first axis, and a plurality of columns extending along a second axis, perpendicular to the first axis. The non-volatile memory array includes a plurality of field isolation regions located in a semiconductor substrate and a plurality of word lines extending over the semiconductor substrate along the first axis, wherein the word lines form control gates of the 2-bit NVM transistors. Oxide-nitride-oxide (ONO) structures are formed between the substrate and the word lines, wherein the nitride layer provides floating gate storage for the NVM transistors. A plurality of H-shaped source/drain regions are defined by the field isolation regions and the word lines, wherein each source/drain region serves as a source/drain for four different NVM transistors in the array.
机译:一种非易失性存储器(NVM)阵列,包括:多个2位NVM晶体管,该多个2位NVM晶体管布置成沿第一轴延伸的多行,以及沿垂直于第一轴的第二轴延伸的多列。非易失性存储器阵列包括位于半导体衬底中的多个场隔离区域和沿着第一轴在半导体衬底上方延伸的多条字线,其中这些字线形成2位NVM晶体管的控制栅极。氧化物-氮化物-氧化物(ONO)结构形成在衬底和字线之间,其中氮化物层为NVM晶体管提供浮栅存储。多个H形源极/漏极区域由场隔离区域和字线限定,其中每个源极/漏极区域用作阵列中四个不同NVM晶体管的源极/漏极。

著录项

  • 公开/公告号US6765259B2

    专利类型

  • 公开/公告日2004-07-20

    原文格式PDF

  • 申请/专利权人 TOWER SEMICONDUCTOR LTD.;

    申请/专利号US20020233310

  • 发明设计人 JONGOH KIM;

    申请日2002-08-28

  • 分类号H01L297/88;

  • 国家 US

  • 入库时间 2022-08-21 23:18:33

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