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Integrated delay discriminator for use with a field-programmable gate array and a method of determining a time delay thereof

机译:用于现场可编程门阵列的集成延迟鉴别器及其确定时间延迟的方法

摘要

An integrated delay discriminator for use with a field-programmable gate array including a reference path and a response path. The reference path is associated with a first delay of a first portion of the field-programmable gate array, and is configured to provide an event initiation marker for opening a delay measurement window. The response path is coupled to the reference path and is associated with a second delay of a second portion of the field-programmable gate array. The response path is configured to provide an event termination marker for closing the delay measurement window that was opened by the reference path. This allows a time delay determination measurement between the first portion and the second portion of the field-programmable gate array.
机译:一种集成的延迟鉴别器,可与包括参考路径和响应路径的现场可编程门阵列配合使用。参考路径与现场可编程门阵列的第一部分的第一延迟相关联,并且被配置为提供事件起始标记以用于打开延迟测量窗口。响应路径耦合到参考路径,并且与现场可编程门阵列的第二部分的第二延迟相关联。响应路径配置为提供事件终止标记,以关闭由参考路径打开的延迟测量窗口。这允许在现场可编程门阵列的第一部分和第二部分之间进行时间延迟确定测量。

著录项

  • 公开/公告号US6795959B1

    专利类型

  • 公开/公告日2004-09-21

    原文格式PDF

  • 申请/专利权人 LATTICE SEMICONDUCTOR CORPORATION;

    申请/专利号US20020103100

  • 发明设计人 CHRISTOPHER D. OCHS;

    申请日2002-03-21

  • 分类号G06F175/00;

  • 国家 US

  • 入库时间 2022-08-21 23:18:25

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