首页> 外国专利> Reduced noise sensitivity method and apparatus for converting an interferogram phase map to a surface profile map

Reduced noise sensitivity method and apparatus for converting an interferogram phase map to a surface profile map

机译:用于将干涉图相位图转换为表面轮廓图的降低噪声灵敏度的方法和装置

摘要

In the process of converting an interferogram phase map to a surface profile, in the absence of tilt, a histogram of occurrences of phase values is created from phase data. Useful data are identified in bins with contents that exceed a threshold value. Where useful data wrap around the end of the histogram, a selected amount of phase shift is added to the phase data to move them all within the ends of the histogram. Where tilt is present, the phase data are differentiated to produce slope data and a histogram of occurrences of slope values is created. A best-fit amount of tilt is determined from the slope histogram by selecting the bin at the average between two points on the histogram curve that are a predetermined percentage of the maximum height of the curve. Thereafter, the best-fit tilt is subtracted from the original phase data to eliminate tilt.
机译:在将干涉图相位图转换为表面轮廓的过程中,在不存在倾斜的情况下,根据相位数据创建出现相位值的直方图。有用的数据在内容超过阈值的容器中进行标识。如果有用数据环绕直方图的末端,则将选定量的相移添加到相位数据,以将它们全部移至直方图的末端。在存在倾斜的情况下,微分相位数据以产生斜率数据,并创建斜率值出现的直方图。通过选择直方图曲线上两个点之间的平均值处的bin,确定最佳的倾斜量,该bin是曲线最大高度的预定百分比。此后,从原始相位数据中减去最佳拟合倾斜度以消除倾斜度。

著录项

  • 公开/公告号US6738511B1

    专利类型

  • 公开/公告日2004-05-18

    原文格式PDF

  • 申请/专利权人 VEECO INSTRUMENTS INC.;

    申请/专利号US20000679277

  • 发明设计人 COLIN T. FARRELL;JON D. HERRON JR.;

    申请日2000-10-04

  • 分类号G06K90/00;

  • 国家 US

  • 入库时间 2022-08-21 23:16:58

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