首页> 外国专利> Two-stage multiwavelength thermal radiation analyzer

Two-stage multiwavelength thermal radiation analyzer

机译:两级多波长热辐射分析仪

摘要

The invention provides a passive two-stage multiwavelength approach for measuring temperature, emissivity and stray-light levels. The first stage comprises the steps of, (1) acquiring spectral intensity measurements over a predetermined spectral width of a thermal radiation source radiating at a true effective spectral emissivity and with a true source temperature, (2) forming a composite function that relates said spectral intensity measurements to the true effective spectral emissivity and the true source temperature, (3) providing emissivity estimating means for approximately determining how the true effective emissivity affects the color temperature of the thermal radiation source, (4) substituting an estimated effective spectral emissivity for the true effective spectral emissivity within the composite function such that the estimated emissivity approximately accounts for the effects of the true effective emissivity on the color temperature, (5) substituting a source temperature projection for the true source temperature within the composite function, and (6) utilizing the composite function to provide a best-fit correlation between the spectral intensity measurements, the estimated emissivity, and the projected source temperature such that when the projected source temperature equals the true source temperature the composite function attains an extremum, thereby obtaining an approximation of said source temperature. The second stage comprises the steps of (1) utilizing spectral acquisition means to acquire and measure a set of multiple spectral intensity distributions of a thermal radiation source radiating at multiple source temperatures at an effective spectral emissivity, wherein each of the spectral intensity distributions is associated with a particular source temperature, and (2) forming a first function of at least two of the measured spectral intensity distributions and of a set of temperature variables that represent the temperatures of the spectral intensity distributions used, such that the first function attains an extremum when the temperature variables equal the corresponding source temperatures, thereby calculating the source temperatures.
机译:本发明提供了一种用于测量温度,发射率和杂散光水平的无源两级多波长方法。第一步包括以下步骤:(1)获取以真实有效光谱发射率和真实源温度辐射的热辐射源的预定光谱宽度上的光谱强度测量结果;(2)形成与所述光谱相关的复合函数强度测量值到真实的有效光谱发射率和真实的源温度,(3)提供发射率估算手段,用于大致确定真实的有效发射率如何影响热辐射源的色温,(4)用估计的有效光谱发射率代替复合函数内的真实有效光谱发射率,以使估计的发射率大致说明了真实有效发射率对色温的影响;(5)用源温度投影替代复合函数内的真实源温度;以及(6)利用复合函数提供bes光谱强度测量值,估计的发射率和预计的源温度之间的t拟合相关性,使得当预计的源温度等于真实的源温度时,复合函数达到极值,从而获得所述源温度的近似值。第二阶段包括以下步骤:(1)利用光谱获取装置来获取和测量以有效光谱发射率在多个源温度下辐射的热辐射源的一组多个光谱强度分布,其中每个光谱强度分布是相关的(2)形成至少两个测得的光谱强度分布以及代表所用光谱强度分布温度的一组温度变量的第一函数,以使第一函数达到极值当温度变量等于相应的源温度时,从而计算源温度。

著录项

  • 公开/公告号US6738724B2

    专利类型

  • 公开/公告日2004-05-18

    原文格式PDF

  • 申请/专利权人 MCINTOSH DEVON R.;

    申请/专利号US20020162408

  • 发明设计人 DEVON R. MCINTOSH;

    申请日2002-06-04

  • 分类号G01J50/00;

  • 国家 US

  • 入库时间 2022-08-21 23:16:58

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号