首页> 外国专利> Intelligent test point selection for bit error rate tester-based diagrams

Intelligent test point selection for bit error rate tester-based diagrams

机译:基于误码率测试仪的图表的智能测试点选择

摘要

Method and apparatus for constructing diagrams representing the relationship between variable quantities. According to the method, at least one first measurement point representing the relationship between the variable quantities is provided for initially constructing the diagram. Thereafter, at least one location is selected at which the relationship between the variable quantities is to be measured, the at least one location being selected as a function of the at least one measurement point. The relationship between the variable quantities is then measured at the at least one location to provide at least one additional measurement point for further constructing the diagram. The invention permits diagrams, such as V Curve diagrams, Bathtub Curve diagrams and Eye Diagrams, to be constructed in less time and using fewer measurement points than conventional diagram construction procedures.
机译:用于构造表示可变量之间的关系的图的方法和装置。根据该方法,提供至少一个表示可变量之间的关系的第一测量点,用于初始地构造该图。此后,选择至少一个位置,在该位置上要测量可变量之间的关系,根据至少一个测量点来选择至少一个位置。然后在至少一个位置处测量可变量之间的关系,以提供至少一个附加的测量点,以进一步构造该图。本发明允许比常规图构建程序以更少的时间和更少的测量点来构建诸如V曲线图,浴缸曲线图和眼图之类的图。

著录项

  • 公开/公告号US2003225541A1

    专利类型

  • 公开/公告日2003-12-04

    原文格式PDF

  • 申请/专利权人 ABRAMOVITCH DANIEL YVES;

    申请/专利号US20020162405

  • 发明设计人 DANIEL YVES ABRAMOVITCH;

    申请日2002-06-03

  • 分类号G06F15/00;

  • 国家 US

  • 入库时间 2022-08-21 23:14:47

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号