首页> 外国专利> Method and system for providing source/drain-gate spatial overlap engineering for low-power devices

Method and system for providing source/drain-gate spatial overlap engineering for low-power devices

机译:为低功率设备提供源极/漏极门空间重叠工程的方法和系统

摘要

A method and system for providing a semiconductor device on a substrate are disclosed. The method and system include providing a tunneling barrier on the substrate and providing at least one gate on the tunneling barrier. The at least one of gate includes a first edge, a second edge and a base. The method and system further include providing a source and/or a drain for the at least one gate. The source and/or a drain are in proximity to the first edge or the first and second edges of the at least one gate. The at least one gate, the source and/or drain or both the at least one gate and the source and/or drain are configured such that source and/or drain do not substantially overlap the at least one gate at the base of the at least one gate.
机译:公开了一种用于在衬底上提供半导体器件的方法和系统。该方法和系统包括在衬底上提供隧道势垒并且在隧道势垒上提供至少一个栅极。栅极中的至少一个包括第一边缘,第二边缘和基极。该方法和系统还包括为至少一个栅极提供源极和/或漏极。源极和/或漏极靠近至少一个栅极的第一边缘或第一边缘和第二边缘。至少一个栅极,源极和/或漏极或至少一个栅极与源极和/或漏极两者都被配置为使得源极和/或漏极基本上不与位于栅极底部的至少一个栅极重叠。至少一扇门。

著录项

  • 公开/公告号US6646326B1

    专利类型

  • 公开/公告日2003-11-11

    原文格式PDF

  • 申请/专利权人 ADVANCED MICRO DEVICES INC.;

    申请/专利号US20000714361

  • 发明设计人 JONGWOOK KYE;HYEON-SEAG KIM;

    申请日2000-11-15

  • 分类号H01L290/60;

  • 国家 US

  • 入库时间 2022-08-21 23:14:10

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号