首页>
外国专利>
Light wavelength measuring apparatus and method for measuring wavelength of subject light with high speed by using two-beam interferometer
Light wavelength measuring apparatus and method for measuring wavelength of subject light with high speed by using two-beam interferometer
展开▼
机译:利用二光束干涉仪高速测量被摄体波长的光波长测量装置和方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
A two-beam interferometer splits an incident light in two optical paths, combines and outputs split lights together again. The two-beam interferometer generates at least one or more combined light made from two beams each having a polarization different from each other. A polarization state detector detects a variation in the polarization of the combined light generated by the two-beam interferometer. An electric circuit calculates an wavelength of the incident light based on the variation in the polarization detected by the polarization state detector. The two optical paths of the two-beam interferometer has a difference in length between a point of splitting the incident light and a point of combining the split lights, for the detection of polarization variation in the combined light by the polarization state detector. The optical path length difference between the two paths is fixed.
展开▼