A nondestructive testing method of condensed matter surfaces, and a sensing device for the measurement of the work function of the surface of a conducting or semiconducting sample. The sensing device includes an ionization chamber, a probe having a first surface, and a potential difference measurement circuit that is capable of measuring a difference in potential between the first surface of the probe and a surface made of another material to be tested. The ionization chamber produces ionized particles that travel out of an output of the ionization chamber and toward the probe. The probe is a non-vibrating probe having a first surface that is either a positively or negatively charged electrode. The measurement circuit of the present invention is capable of sensing the small amount of electrical current that the electrons and ions moving toward the first surface and the testing surface represent.
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