首页> 外国专利> Wavefront sensing device for measuring optical aberrations with symmetry cilu00ecndrica

Wavefront sensing device for measuring optical aberrations with symmetry cilu00ecndrica

机译:波场传感装置,用于对称对称测量光学像差

摘要

"The device sensor wavefront with symmetry cilu00ecndrica to measure optical aberrations.Remarkably, a technique with cylindrical symmetry to measure wavefront that emerges from optical systems, and determine through these aberrations present in such a system.The device which implements this technique is mainly based on a lens with this symmetry called concentric logs.And formed by successive rings of cylindrical lenses which close upon themselves forming circles.The basic principle of operation used in the project requires an optical system to focus the light emitted from a laser beam emitting source at the back of the eye, i.e., in the retina.The reflected light from a diffuse form from this point through the optical system, which is the eye, and then is projected through the lens concentric on a CCD sensor logs.The points raised in the sensor are processed mathematically in an algorithm adapted to cylindrical symmetry, and written in functions also adapted this symmetry.The results are the components of the aberrations present in the eye, written in polar coordinates in terms of the polynomials of Zernike.
机译:具有对称性的设备传感器波前可以测量光学像差。值得注意的是,具有圆柱对称性的技术可以测量从光学系统中出现的波前,并通过此类系统中存在的这些像差来确定。实现此技术的设备是主要由具有这种对称性的同心圆镜构成,并由圆柱透镜的连续环形成,这些环彼此紧紧闭合,形成圆环。项目中使用的基本操作原理需要光学系统来聚焦从激光束发射出的光该点的散射光通过眼睛的光学系统从扩散点反射回来,然后通过同心透镜投射到CCD传感器对数上的透镜上。传感器中产生的凸起将通过适合圆柱对称性的算法进行数学处理,并写入也适用于该对称性的函数中。 s是眼中存在的像差的组成部分,以Zernike多项式的极坐标表示。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号