首页> 外国专利> A METHOD FOR DETECTION OF MICROMETRIC AND SUB-MICROMETRIC IMAGES BY MEANS OF IRRADIATION OF A MASK OR OF A BIOLOGICAL SPECIMEN WITH IONIZING RADIATION

A METHOD FOR DETECTION OF MICROMETRIC AND SUB-MICROMETRIC IMAGES BY MEANS OF IRRADIATION OF A MASK OR OF A BIOLOGICAL SPECIMEN WITH IONIZING RADIATION

机译:用电离辐射辐照面膜或生物标本的方法检测微观和亚微观图像的方法

摘要

Described herein is a method for detection of micrometric and sub-micrometricimages with high resolution and high dynamics of contrast, and suited forenabling microradiography, x-ray microscopy and the production of colouredconfigurations in dielectric materials. The method consists of radiation ofenergy comprised between 20 and 2000 eV for irradiating a mask or a biologicalspecimen and use of a detector consisting of LiF in the form of a crystal or afilm. The power of the radiation released in the LiF detector during exposureis preferably = 10mW/cm3.
机译:本文描述了一种用于检测微米和亚微米的方法具有高分辨率和高动态对比度的图像,适用于进行显微放射照相,X射线显微镜检查和着色的产生介电材料中的配置。该方法包括辐射包含20到2000 eV的能量,用于照射口罩或生物样品和由晶体或锂离子形式的LiF组成的检测器的使用电影。曝光期间LiF检测器释放的辐射功率优选≥10mW/ cm 3。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号