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IMAGING SYSTEMS AND PARTICLE DETECTORS USING SILICON ENRICHED BY HEAVIER ELEMENTS

机译:使用富含重元素的硅的成像系统和颗粒检测器

摘要

An imaging and particle detection system using silicon enriched by heavier elements. An element which has been found to be highly effective in these applications is germanium. The silicon material enriched by germanium has an improved absorption coefficient, which is essential for effective particle detection in imaging applications. At low energies, silicon alone absorbs well. At high energies, silicon enriched by germanium has proven effective. Typical applications include medical imaging systems, x-ray imaging systems, non-destructive testing systems, environmental monitoring systems, nuclear imaging systems, fluorescent chemical analysis systems, and x-ray astronomy systems.
机译:使用富含重元素的硅的成像和粒子检测系统。已发现在这些应用中非常有效的元素是锗。富含锗的硅材料具有改善的吸收系数,这对于在成像应用中进行有效的颗粒检测至关重要。在低能量下,仅硅吸收良好。在高能量下,已证明富含锗的硅是有效的。典型的应用包括医学成像系统,X射线成像系统,无损检测系统,环境监测系统,核成像系统,荧光化学分析系统和X射线天文学系统。

著录项

  • 公开/公告号WO02067271A3

    专利类型

  • 公开/公告日2004-03-04

    原文格式PDF

  • 申请/专利号WO2002IL00111

  • 发明设计人 RUZIN ARIE;

    申请日2002-02-13

  • 分类号G01T1/24;G01T7/00;

  • 国家 WO

  • 入库时间 2022-08-21 23:00:47

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