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SYSTEM FOR MEASURING WAVEFRONT TILT IN OPTICAL SYSTEMS AND METHOD OF CALIBRATING WAVEFRONT SENSORS

机译:光学系统中波前倾斜的测量系统和波前传感器的校准方法

摘要

A wavefront tilt measurement system includes a light source (110) that emits light from a primary aperture (102). A plurality of tilt sensors (114) are adjacent to the primary aperture (102) and each tilt sensor includes a sensor focal plane (106) and a plurality of detector elements. Each tilt sensor generates at the focal plane a plurality of overlapping regions of zero and first order images of light emerging from the primary aperture. The measured intensity of light in the overlapping regions is used to determine the wavefront tilt of light emerging from the primary aperture (102).
机译:波前倾斜测量系统包括从主孔(102)发射光的光源(110)。多个倾斜传感器(114)与主孔(102)相邻,并且每个倾斜传感器包括传感器焦平面(106)和多个检测器元件。每个倾斜传感器在焦平面上产生从主光圈出射的光的零和一阶图像的多个重叠区域。在重叠区域中测得的光强度用于确定从主孔(102)出射的光的波前倾斜。

著录项

  • 公开/公告号WO03102499A1

    专利类型

  • 公开/公告日2003-12-11

    原文格式PDF

  • 申请/专利权人 OPTICAL PHYSICS COMPANY;

    申请/专利号WO2003US16594

  • 发明设计人 OTTO OBERDAN W.;HUTCHIN RICHARD A.;

    申请日2003-05-28

  • 分类号G01B9/02;

  • 国家 WO

  • 入库时间 2022-08-21 22:59:47

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