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Ring oscillator and test method and apparatus employing a ring oscillator for verifying fabrication of transistors in an integrated circuit
Ring oscillator and test method and apparatus employing a ring oscillator for verifying fabrication of transistors in an integrated circuit
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机译:环形振荡器以及使用环形振荡器来验证集成电路中晶体管的制造的测试方法和装置
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摘要
A ring oscillator for a test apparatus and method for verifying fabrication of transistors in an integrated circuit on a die under test is implemented. The ring oscillator is fabricated on the die and includes a positive feedback loop between a circuit output terminal and a feedback input terminal. The feedback loop includes a plurality of delaying stages connected in cascade. A transfer gate is coupled to each delaying stage. Each of the transfer gates includes a pair of transistors of the first and second conductivity types connected in parallel. The ring oscillator is operable to provide a first oscillator output signal during a first test mode when the transistors of the first conductivity type are ON and the transistors of the second conductivity type are OFF. The ring oscillator is operable to provide a second oscillator output signal during a second test mode when the transistors of the first conductivity type are OFF and the transistors of the second conductivity type are ON. The ring oscillator is operable to provide a second oscillator output signal during a second test mode when the transistors of the first conductivity type are ON and the transistors of the second conductivity type are ON.
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