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Phased array ultrasonic inspection method for industrial applications

机译:工业用相控阵超声检查方法

摘要

A method for inspecting a component (10) includes exciting a number of transducers (12) forming an array (14) to produce an ultrasonic transmission beam (beam) focused into the component. The array and the component are separated by a standoff (18). A number of echo signals are generated using the transducers, and the echo signals are processed in a number of channels. The processing includes both dynamical focus and providing a dynamic aperture (24) on receive, both of which compensate for refraction of the beam at the component/standoff interface. A single-turn inspection method includes: (a) positioning the array facing the component, (b) exciting the transducers, (c) generating a number of echo signals, (d) changing the relative angular orientation of the array and the component around an axis (26) and repeating steps (b) and (c), and (e) processing the echo signals to form at least one processed echo signal.
机译:一种用于检查部件(10)的方法,包括激发形成阵列(14)的多个换能器(12),以产生聚焦在部件中的超声传输束(束)。阵列和组件之间由一个支架(18)隔开。使用换能器产生许多回波信号,并且在许多通道中处理回波信号。该处理既包括动态聚焦,又包括在接收时提供动态孔径(24),这两者都补偿了光束在组件/支架界面处的折射。单圈检查方法包括:(a)将阵列面对组件放置;(b)激发换能器;(c)产生多个回波信号;(d)改变阵列和组件在周围的相对角度方向轴(26)以及重复步骤(b)和(c),以及(e)处理回波信号以形成至少一个处理后的回波信号。

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