Analyzer arrangement is dynamic at material flow for repeatedly analysis group. X-ray radiation source (123,205), irradiates target material flowing and detector (120,121,303,304,305,309) detect fluorescent radiation total amount. The device (308,319,500,501,502,503,504) of cooler keeps the low temperature of at least part of detector. Processing electronic device (311,401,404,405) is converted to testing result and is converted into concentration value, and the multiple analysis group is dynamic at material flow. X-ray radiation light source (123,205) is X-ray tube. Analyser device further comprises controllable high-voltage power supply (204), is connected to the X-ray tube (123,205). Detector element (303) includes solid state semiconductor detector, and the device (308,319,500,501,502,503,504) of cooling device includes peltier (Peltier) unit. X-ray radiation source (123,205), the high-voltage power supply (204), detector (120,121,303,304,305,309), the cooler arrangement (1230, (1231, (1232, (1233, (1234, (1235, (1236 with processing electronic equipment (1237, (1238, (1239,205) 0 be respectively positioned in single mechanical entities 205) 1.
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