首页> 外国专利> MARK POSITION DETECTION APPARATUS FOR DETECTING MARK POSITION BY USING OPTICAL ELEMENT AND NOT MEASUREMENT SAMPLE HAVING OPTICAL CHARACTERISTIC

MARK POSITION DETECTION APPARATUS FOR DETECTING MARK POSITION BY USING OPTICAL ELEMENT AND NOT MEASUREMENT SAMPLE HAVING OPTICAL CHARACTERISTIC

机译:用于通过使用光学元件而非具有光学特性的测量样本来检测标记位置的标记位置检测装置

摘要

PURPOSE: A mark position detection apparatus is provided to detect a mark position by using an optical element and not a measurement sample having an optical characteristic. CONSTITUTION: A mark position detection apparatus includes an illumination optical system(10) and an imaging optical system(20). The illumination optical system(10) illuminates a measurement mark with illumination light. The imaging optical system converges light reflected from the measurement mark so as to form an image of the measurement mark onto an image photographing device(30). The mark position detection apparatus measures a positional displacement of the measurement mark by processing an image signal obtained by the image photographing device(30). The mark position detection apparatus forms an optical element in the imaging optical system(20). The optical element compensates for an asymmetric difference of the image signal due to a wavelength of the illumination light.
机译:目的:提供一种标记位置检测装置,以通过使用光学元件而不是具有光学特性的测量样品来检测标记位置。构成:一种标记位置检测装置,包括照明光学系统(10)和成像光学系统(20)。照明光学系统(10)用照明光照明测量标记。成像光学系统会聚从测量标记反射的光,从而将测量标记的图像形成在图像拍摄装置(30)上。标记位置检测设备通过处理由图像拍摄装置(30)获得的图像信号来测量测量标记的位置偏移。标记位置检测设备在成像光学系统(20)中形成光学元件。光学元件补偿由于照明光的波长引起的图像信号的不对称差异。

著录项

  • 公开/公告号KR20040077534A

    专利类型

  • 公开/公告日2004-09-04

    原文格式PDF

  • 申请/专利权人 NIKON CORPORATION;

    申请/专利号KR20040013367

  • 发明设计人 FUKUI TATSUO;ENDO TAKESHI;

    申请日2004-02-27

  • 分类号G01B11/00;

  • 国家 KR

  • 入库时间 2022-08-21 22:48:07

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