APPARATUS FOR MEASURING THICKNESS AND REFRACTIVE INDEX OF MATERIAL IN REAL TIME USING SURFACE PLASMON RESONANCE PHENOMENON

摘要

PURPOSE: An apparatus for measuring a thickness and a refractive index of a material in real time is provided to precisely measure the thickness and refractive index of the material in real time by using a planer optical system having a simple structure and by using a surface plasmon resonance phenomenon. CONSTITUTION: An apparatus measures a thickness and a refractive index of a material in real time by using a surface plasmon resonance phenomenon. A surface plasmon resonance measuring unit is provided in a planer optical system. A white light source(1) is provided for the measurement. White light radiated from the white light source(1) is focused onto a material by using a cylindrical lens(2). The cylindrical lens(2) includes a prism for converting a path of the light. The light incident into a CCD camera(6) includes information about characteristics of the material.