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Applying the optical phase interferometry determine the coordinates of the three-dimensional space, the method and system

机译:应用光学相位干涉法确定三维空间的坐标,方法和系统

摘要

Disclosed are a system and a method for determining coordinates of a three-dimensional measurer probe using a beam phase interference method. Two optical fibers are mounted inside the probe, and detecting means obtains an interference pattern generated by beam emitted from a point beam source mounted at ends of the optical fibers. After that, wave front of the interference pattern is measured and a location of the point beam source is determined through a nonlinear optimization from the wave front, and thereby the coordinates of the three-dimensional measurer probe are set. Because the two optical fibers of the inside of the probe to be measured are located in close vicinity to the three-dimensional object, the present measuring system and method can reduce a measurement error, make a structure of the system simple, and thereby reduce a manufacturing cost.
机译:公开了一种用于使用束相位干涉法确定三维测量仪探针的坐标的系统和方法。两根光纤安装在探头内部,检测装置获得由安装在光纤末端的点光束源发射的光束产生的干涉图样。之后,测量干涉图案的波阵面,并通过非线性优化从波阵面确定点束源的位置,从而设置三维测量头的坐标。由于待测探头内部的两根光纤紧邻三维物体,本发明的测量系统和方法可以减少测量误差,使系统结构简单,从而减少了测量误差。制造成本。

著录项

  • 公开/公告号KR100415477B1

    专利类型

  • 公开/公告日2004-01-24

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20010027878

  • 发明设计人 김승우;이혁교;

    申请日2001-05-22

  • 分类号G01B9/02;

  • 国家 KR

  • 入库时间 2022-08-21 22:47:35

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