CHARACTERISTIC MEASURING SYSTEM FOR FIELD EMISSION DISPLAY DEVICE, INCLUDING WAVEFORM GENERATOR, RESISTOR, ELECTRON FOCUSING UNIT, WAVEFORM DETECTION UNIT AND COMPUTATION UNIT

摘要

PURPOSE: A characteristic measuring system is provided to quickly measure electrical characteristics in each of pixels of field emission array, and estimate luminance characteristics by using data. CONSTITUTION: A characteristic measuring system comprises a waveform generator(20) for applying voltage of a predetermined waveform to a gate(4); a resistor(30) connected between an anode(1) and a grounding terminal; an electron focusing unit(80) for focusing electrons emitted to an anode(2); a waveform detection unit for detecting waveform of the voltage input to the gate from the waveform generator and output waveform between the cathode and the resistor; and a computation unit for analyzing the waveform detected by the waveform detection unit, and computing an equivalent resistance value and equivalent capacitance between the gate and the cathode by performing a predetermined computation in accordance with the result of the analysis.