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Output buffer circuit for reducing variation of slew rate due to variation of PVT and variation of load capacitance of output terminal and semiconductor device including the same
Output buffer circuit for reducing variation of slew rate due to variation of PVT and variation of load capacitance of output terminal and semiconductor device including the same
An output buffer circuit for reducing a variation of the slew rate due to a variation of process, voltage and temperature (PVT) and the load capacitance of an output terminal, and semiconductor device including the same, include a first slew rate control circuit for pulling down the voltage of a pull-up signal in multiple stages in response to a first control signal, and a second slew rate control circuit for pulling up the voltage of a pull-down signal in multiple stages in response to a second control signal. A pull-up driver is provided for pulling up an output terminal in response to the pull-up signal, and a pull-down driver is provided for pulling down the output terminal in response to the pull-down signal. The first and second slew rate control circuits are controlled by bias voltages that are provided by a phase locked loop circuit and compensate for changes in PVT.
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