首页> 外国专利> HEAD TEST METHOD OF A HARD DISK DRIVE, FOR PREVENTING AN ERROR CAUSED BY A HEAD HAVING A SMALL DEGREE OF INFERIORITY BY PREVIOUSLY SORTING OUT THE HEAD

HEAD TEST METHOD OF A HARD DISK DRIVE, FOR PREVENTING AN ERROR CAUSED BY A HEAD HAVING A SMALL DEGREE OF INFERIORITY BY PREVIOUSLY SORTING OUT THE HEAD

机译:硬盘驱动器的磁头测试方法,用于通过事先分出磁头来防止磁头因自卑而导致的错误

摘要

PURPOSE: A head test method of a hard disk drive is provided to perform a write/read test for a head while an unsaturated current is applied, and to off-track the head while a saturated current is applied, then to test whether an off track write operation influences an adjacent track, thereby previously sorting out a head having a small degree of inferiority to prevent an error. CONSTITUTION: A micro controller locates a head to be tested on a specific track(110). The micro controller applies an unsaturated current to the head(112), and performs a write/read test in the first data patterns(114). The micro controller compares read data with written data, and carries out a squeeze test if an error is not generated(200). The micro controller decides whether an error is generated during the squeeze test(118). If so, the micro controller displays that the head is inferior(120).
机译:目的:提供一种硬盘驱动器的磁头测试方法,以在施加不饱和电流的同时对磁头执行写/读测试,并在施加饱和电流的情况下使磁头偏离磁道,然后测试磁头是否断开磁道写操作会影响相邻的磁道,从而预先挑选出劣质度较小的磁头以防止出错。组成:一个微控制器将要测试的磁头定位在特定的轨道上(110)。微控制器向磁头(112)施加不饱和电流,并在第一数据模式(114)中执行写/读测试。微控制器将读取的数据与写入的数据进行比较,如果没有产生错误,则进行挤压测试(200)。微控制器确定在挤压测试期间是否产生错误(118)。如果是这样,则微控制器显示头部在下(120)。

著录项

  • 公开/公告号KR100440792B1

    专利类型

  • 公开/公告日2004-07-08

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR19970017852

  • 发明设计人 SON BYEONG GUK;

    申请日1997-05-09

  • 分类号G11B21/02;

  • 国家 KR

  • 入库时间 2022-08-21 22:46:50

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