SINGLE-CHIP MICROCOMPUTER WITH DYNAMIC BURN-IN TEST FUNCTION AND DYNAMIC BURN-IN TESTING METHOD THEREFOR

摘要

In a single-chip microcomputer including a nonvolatile semiconductor memory device and write, read and erase circuits for performing a write operation, a read operation and an erase operation upon the nonvolatile semiconductor memory device, respectively, a sequencer is connected between the write, read and erase circuits and an interface. The sequencer receives first data via the interface from the exterior to write the first data into the nonvolatile semiconductor memory device, reads the first data from the nonvolatile semiconductor device, compares the first data with second data read via the interface from the exterior thus performing a verification upon the nonvolatile semiconductor memory device, and reads third data from the nonvolatile semiconductor memory device and transmits the third data via the interface to the exterior.