首页> 外国专利> Fabry-Perot interferometer resonant frequency measurement method, which is applicable to a micro-mechanically tunable interferometer, involves measurement of the capacitance of electrodes attached to the cavity mirrors

Fabry-Perot interferometer resonant frequency measurement method, which is applicable to a micro-mechanically tunable interferometer, involves measurement of the capacitance of electrodes attached to the cavity mirrors

机译:Fabry-Perot干涉仪共振频率测量方法,适用于微机械可调干涉仪,涉及对附着在腔镜上的电极电容的测量

摘要

Method for absolute measurement of the resonant frequency of a micro-mechanically tunable Fabry-Perot interferometer, whereby the resonant frequency or wavelength is determined from a filtered signal by determination of the capacitance between two electrodes attached to mirror surfaces of the interferometer cavity in areas of the mirrors that are optically not used.
机译:绝对测量法布里-珀罗微机械可调干涉仪共振频率的方法,其中共振频率或波长是通过确定附着在干涉仪腔镜表面上的两个电极之间的电容来确定的,从滤波信号中确定共振频率或波长。光学上未使用的镜子。

著录项

  • 公开/公告号DE10240211A1

    专利类型

  • 公开/公告日2004-03-11

    原文格式PDF

  • 申请/专利权人 RIEMENSCHNEIDER FRANK;

    申请/专利号DE2002140211

  • 发明设计人 RIEMENSCHNEIDER FRANK;

    申请日2002-08-28

  • 分类号G01J3/26;G01M11/02;G02B26/00;G02B5/28;

  • 国家 DE

  • 入库时间 2022-08-21 22:44:00

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