Apparatus useful for detection of matter on technical surface, directs bundled light beam at it, with position resolution camera to register generated fluorescence

摘要

Apparatus for detection of material layer(s) on technical surface, comprises lamp which directs bundled light beam at material on surface. Detector(s) register fluorescent radiation generated by material through illumination. An apparatus for the detection of material layer(s) (2) on a technical surface (1), comprises a lamp (3) which directs a bundled light beam (6) at the material on the surface. Detector(s) (4) register the fluorescent radiation (9) generated by the material through the illumination. The bundled light beam forms a point or linear pattern on the surface forming an enclosed angle with it of 0degrees at most alpha at most 90degrees. The detector forms a position resolution camera system with a camera viewing direction (8) forming an enclosed angle with the surface of 0degrees at most beta at most 90degrees. alpha and beta are unequal. The surface can be moved in relation to the bundled light beam.