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IC calibration method, especially for the output driver parameters, OCD and ODT, on chip driver and on die terminations, of DDR-DRAMs, whereby a common calibration reference is connected via a bus to multiple units
IC calibration method, especially for the output driver parameters, OCD and ODT, on chip driver and on die terminations, of DDR-DRAMs, whereby a common calibration reference is connected via a bus to multiple units
Method for calibrating interface drivers (6) of semiconductor arrangements (1) by connection of at least one calibration reference (5) to a calibration connection. The method is particularly used for calibrating parameters of output drivers (6), on chip drivers and terminations. According to the method calibration connections are made to each semiconductor arrangement in turn using an internal switching unit (4) with the switches of other arrangement set to an internal high resistance connection. Independent claims are also included for the following:- (1) a method for operating a data bus system with control and address buses to which a multiplicity of semiconductor arrangements are connected for calibration using a single calibration reference; (2) and a semiconductor arrangement for connection to a control and address bus with a switch for connecting to the bus to permit calibrating of its output driver parameters.
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