首页> 外国专利> IC calibration method, especially for the output driver parameters, OCD and ODT, on chip driver and on die terminations, of DDR-DRAMs, whereby a common calibration reference is connected via a bus to multiple units

IC calibration method, especially for the output driver parameters, OCD and ODT, on chip driver and on die terminations, of DDR-DRAMs, whereby a common calibration reference is connected via a bus to multiple units

机译:IC校准方法,特别是用于DDR-DRAM的片上驱动器和管芯终端上的输出驱动器参数OCD和ODT,从而通过总线将公共校准参考连接到多个单元

摘要

Method for calibrating interface drivers (6) of semiconductor arrangements (1) by connection of at least one calibration reference (5) to a calibration connection. The method is particularly used for calibrating parameters of output drivers (6), on chip drivers and terminations. According to the method calibration connections are made to each semiconductor arrangement in turn using an internal switching unit (4) with the switches of other arrangement set to an internal high resistance connection. Independent claims are also included for the following:- (1) a method for operating a data bus system with control and address buses to which a multiplicity of semiconductor arrangements are connected for calibration using a single calibration reference; (2) and a semiconductor arrangement for connection to a control and address bus with a switch for connecting to the bus to permit calibrating of its output driver parameters.
机译:通过将至少一个校准基准(5)连接到校准连接来校准半导体装置(1)的接口驱动器(6)的方法。该方法特别用于在芯片驱动器和终端上校准输出驱动器(6)的参数。根据该方法,依次使用内部开关单元(4)对每个半导体装置进行校准连接,而将其他装置的开关设置为内部高电阻连接。还包括以下方面的独立权利要求:-(1)一种用于操作具有控制和地址总线的数据总线系统的方法,其中多个半导体装置连接到该控制总线和地址总线,以使用单个校准基准进行校准; (2)以及用于连接到控制和地址总线的半导体装置,该半导体装置具有用于连接到总线以允许对其输出驱动器参数进行校准的开关。

著录项

  • 公开/公告号DE10245536A1

    专利类型

  • 公开/公告日2004-04-15

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE2002145536

  • 申请日2002-09-30

  • 分类号G06F13/38;G06F11/27;H04L7/04;

  • 国家 DE

  • 入库时间 2022-08-21 22:43:55

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