首页> 外国专利> Method for mfr of semiconductor component controllable by field effects, e.g. various types of field effect transistors, such as N-channel MOSFETs, double diffused MOSFETs (DMOSFETS) etc., contg. semiconductor body with channel zone

Method for mfr of semiconductor component controllable by field effects, e.g. various types of field effect transistors, such as N-channel MOSFETs, double diffused MOSFETs (DMOSFETS) etc., contg. semiconductor body with channel zone

机译:通过场效应例如半导体场效应可控制半导体组件的方法续接各种类型的场效应晶体管,例如N沟道MOSFET,双扩散MOSFET(DMOSFET)等。带有通道区的半导体本体

摘要

The semiconductor body (100,110) has two connection zones (120,121,130) of first conductivity, between which, in front side region, is formed channel zone (140,141) of conductivity complementary to first conductivity. A gate electrode (170), insulated from semiconductor body, is formed on body front side and adjacent to channel zone.The gate electrode is formed after forming channel zone in region of front side of semiconductor body. In first connection zone (120,121), in region of front side of semiconductor (110), is formed heavily doped contact zone.
机译:半导体本体(100,110)具有两个第一导电率的连接区(120,121,130),在它们之间在前侧区域中形成导电率与第一导电率互补的沟道区(140,141)。与半导体主体绝缘的栅电极(170)形成在主体前侧且邻近沟道区。在半导体主体前侧的区域中形成沟道区之后形成栅电极。在第一连接区(120,121)中,在半导体(110)的前侧的区域中形成重掺杂的接触区。

著录项

  • 公开/公告号DE10255830A1

    专利类型

  • 公开/公告日2004-06-17

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE2002155830

  • 发明设计人 TIHANYI JENOE;SOMMER PETER;

    申请日2002-11-29

  • 分类号H01L21/336;H01L29/78;H01L29/06;

  • 国家 DE

  • 入库时间 2022-08-21 22:43:38

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