首页> 外国专利> Bad unit marking method for marking bad units/parts on system carriers for mounting chips uses a non-removable bad unit marking distinguished from the surrounding area by its color

Bad unit marking method for marking bad units/parts on system carriers for mounting chips uses a non-removable bad unit marking distinguished from the surrounding area by its color

机译:不良单元标记方法,用于标记用于安装芯片的系统载体上的不良单元/零件,使用一种不可移动的不良单元标记,该标记通过其颜色与周围区域区别开

摘要

A fine ball grid array component (1) has a system carrier (SC) (2) supporting strip conductors (3) that link contact surfaces (4) on the SC with a connector block (5). A lasting, non-removable bad unit marking (6) distinguished from the surrounding area by its color is used for marking bad units/parts on the SC.
机译:细球栅阵列组件(1)具有支撑带状导体(3)的系统载体(SC)(2),该带状导体将SC上的接触面(4)与连接器块(5)链接在一起。通过其颜色与周围区域区别开的持久的,不可移动的坏单元标记(6)用于在SC上标记坏单元/零件。

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