首页> 外国专利> Handling device especially for positioning a test head, e.g. for use in testing integrated circuits, has carrier and bearing plates for the test head with cut-out sections to simplify head mounting

Handling device especially for positioning a test head, e.g. for use in testing integrated circuits, has carrier and bearing plates for the test head with cut-out sections to simplify head mounting

机译:专门用于放置测试头的处理设备,例如用于测试集成电路,具有用于测试头的承载板和轴承板,带有切口部分,以简化头的安装

摘要

Handling device, especially for positioning a test head on a testing arrangement has positioning means with which the test head is positioned and a support for it. The support comprises a rotating guide with which the test head is rotated about an axis. The rotating guide has a bearing plate (40) and a carrier plate (50) that rotates relative to the bearing plate. The test head is attached to the carrier plate. The two plates have concentric openings (41, 51) through which connection cables are routed and an insert section (42, 52) in the form of an open segment.
机译:尤其是用于将测试头定位在测试装置上的处理装置具有定位装置,通过该定位装置定位测试头和用于其的支撑件。支撑件包括旋转引导件,测试头通过该旋转引导件绕轴线旋转。旋转引导件具有轴承板(40)和相对于轴承板旋转的承载板(50)。测试头已连接到承载板上。这两个板具有同心的开口(41、51),连接电缆穿过该同心的开口(41、51)以及呈开放段形式的插入部分(42、52)。

著录项

  • 公开/公告号DE10325818B3

    专利类型

  • 公开/公告日2004-09-16

    原文格式PDF

  • 申请/专利权人 HEIGL HELMUTH;

    申请/专利号DE2003125818

  • 发明设计人 HEIGL HELMUTH;

    申请日2003-06-06

  • 分类号F16M11/18;G01B21/00;B25J1/12;F16M11/12;

  • 国家 DE

  • 入库时间 2022-08-21 22:43:20

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