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Handling device especially for positioning a test head, e.g. for use in testing integrated circuits, has carrier and bearing plates for the test head with cut-out sections to simplify head mounting
Handling device especially for positioning a test head, e.g. for use in testing integrated circuits, has carrier and bearing plates for the test head with cut-out sections to simplify head mounting
Handling device, especially for positioning a test head on a testing arrangement has positioning means with which the test head is positioned and a support for it. The support comprises a rotating guide with which the test head is rotated about an axis. The rotating guide has a bearing plate (40) and a carrier plate (50) that rotates relative to the bearing plate. The test head is attached to the carrier plate. The two plates have concentric openings (41, 51) through which connection cables are routed and an insert section (42, 52) in the form of an open segment.
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