Test circuit for large scale integration, has block determination unit that outputs determination result signal to be input to selection unit along with reference and control signals, when signals with equal bits are input

摘要

A block determination unit (310) in block testing unit (301) outputs a determination result signal (335) to be input to selection unit (315) along with reference and control signals (RS,334), when signals (331,333) with equal bits are input. The signals (337) from the block testing units are input to a logic processing unit (303) that outputs a comprehensive determination result signal (338). An independent claim is also included for semiconductor device.