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method and device for the detection of betrachtungszonen and their application for the inspection of products

机译:tra虫钨的检测方法,装置及其在产品检验中的应用

摘要

In a device used to inspect substrates visually, an imaging region and a magnification are specified ahead of time for every component and stored as library data in a memory (23). The memory (23) also contains CAD data, which include the class of each component on the substrate and its location. During initialization, a control unit (22) links the location data for a component extracted from the CAD data to corresponding library data and specifies a field of view and a magnification for every component on the substrate. Using this data, the control unit (22) creates on the substrate a number of viewing zones to be inspected at various magnifications and stores the data specifying these zones in the memory (23). When a substrate is to be inspected, the control unit (22) uses the data specifying these zones to control the position and magnification of an imaging unit (2) to collect image data from each zone successively and display them on a monitor (6). IMAGE
机译:在用于目视检查基板的设备中,针对每个组件提前指定成像区域和放大倍率,并将其作为库数据存储在存储器(23)中。存储器(23)还包含CAD数据,该CAD数据包括基板上的每个组件的类别及其位置。在初始化期间,控制单元(22)将从CAD数据中提取的部件的位置数据链接到相应的库数据,并为基板上的每个部件指定视野和放大率。使用该数据,控制单元(22)在基板上创建多个要以各种放大率检查的观察区域,并将指定这些区域的数据存储在存储器(23)中。当要检查基板时,控制单元(22)使用指定这些区域的数据来控制成像单元(2)的位置和放大倍率,以连续地从每个区域收集图像数据并将其显示在监视器(6)上。 <图像>

著录项

  • 公开/公告号DE69532848D1

    专利类型

  • 公开/公告日2004-05-13

    原文格式PDF

  • 申请/专利权人 OMRON CORP. KYOTO;

    申请/专利号DE19956032848T

  • 申请日1995-12-19

  • 分类号G01N21/88;G06T7/00;

  • 国家 DE

  • 入库时间 2022-08-21 22:41:04

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