integrated halbleiterschaltung measuring and digital tensioning of the schwellenspannung of transistors and related methods

摘要

An integrated circuit includes a plurality of MOSFETs on a substrate. A plurality of sensing MOSFETs are used to generate a plurality of comparison signals based upon comparing signals related to the sensed initial threshold voltages to respective reference voltages from a spread of high to low reference voltage values. The MOSFETs are biased to have a desired effective threshold voltage based upon the plurality of comparison signals. Logic decoding circuits accept the plurality of comparison signals and generate at least one bias control signal. Bias circuits are responsive to the at least one bias control signal for generating a desired bias voltage from among a plurality of bias voltages having a spread of high to low bias voltage values to thereby bias the plurality of MOSFETs to the desired effective threshold voltage. Method aspects of the invention are also disclosed. IMAGE