首页> 外国专利> SURFACE IRREGULARITY MEASURING/EVALUATING METHOD AND SYSTEM, SURFACE IRREGULARITY EVALUATION DEVICE, AND PROGRAM OF SURFACE IRREGULARITY MEASURING/EVALUATING METHOD

SURFACE IRREGULARITY MEASURING/EVALUATING METHOD AND SYSTEM, SURFACE IRREGULARITY EVALUATION DEVICE, AND PROGRAM OF SURFACE IRREGULARITY MEASURING/EVALUATING METHOD

机译:表面不规则性测量/评估方法和系统,表面不规则性评估装置以及表面不规则性测量/评估方法的程序

摘要

PROBLEM TO BE SOLVED: To provide a measuring/evaluating method or the like capable of measurement/evaluation to the degree of quantitative roping having excellent reproducibility or the like without depending on human sensitivity.;SOLUTION: This method has a process for irradiating the measuring object surface with light by a metal halide light source 12 at a prescribed incident angle, a process for receiving light reflected from the surface at an angle corresponding to a reflection angle approximately equal to the incident angle by a CCD camera 15, and converting the reflected light into data of a light intensity distribution, and a process for calculating by an operation device 17 by using an intensity change of light on the surface as an index based on the data.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种能够在不依赖于人类敏感度的情况下,以具有良好的再现性等的定量绕线程度进行测量/评价的测量/评价方法等;解决方案:该方法具有照射测量的过程。通过金属卤化物光源12以预定的入射角向物体表面发射光,该过程用于接收从表面反射的光,该角度对应于由CCD相机15以近似等于入射角的反射角进行反射。将光转换成具有光强度分布的数据,并通过操作装置17进行处理,以基于该数据的表面光的强度变化为指标进行计算。版权所有:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP2005221283A

    专利类型

  • 公开/公告日2005-08-18

    原文格式PDF

  • 申请/专利权人 JFE STEEL KK;

    申请/专利号JP20040027532

  • 发明设计人 TORAO AKIRA;KODAMA TOSHIBUMI;

    申请日2004-02-04

  • 分类号G01N21/892;B21C51/00;G01B11/30;

  • 国家 JP

  • 入库时间 2022-08-21 22:36:07

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