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DOUBLE REFRACTION CHARACTERISTIC MEASURING DEVICE AND DOUBLE REFRACTION CHARACTERISTIC MEASURING METHOD

机译:双折射特性测量装置和双折射特性测量方法

摘要

PROBLEM TO BE SOLVED: To provide a double refraction measuring device and a double refraction measuring method capable of evaluating accurately a measuring object without disturbing conveyance in the middle of continuous conveyance of the measuring object.;SOLUTION: This double refraction measuring device is equipped with a CCD 13 formed by arraying two-dimensionally light receiving parts 13b; and an optical system (a light emitting device 1 to a grism 12) for transmitting light including a prescribed band component into a prescribed range in the width direction of the object 201, spectrally diffracting the transmitted light, and allowing the light transmitted through each prescribed position in the width direction of the object 201 and spectrally diffracted to enter each light receiving part lane of the CCD 13.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种双折射测量装置和双折射测量方法,其能够在连续输送被测物体的过程中准确地评估被测物体而不会干扰输送。通过排列二维光接收部分13b而形成的CCD 13;以及光学系统(发光器件1至光栅12),其用于在被检体201的宽度方向上将包括规定的带成分的光透射到规定的范围内,使所透射的光进行光谱衍射,并使各规定的光透射。在物体201的宽度方向上的位置并进行光谱衍射以进入CCD 13的每个光接收部分通道。;版权所有:(C)2005,JPO&NCIPI

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