首页> 外国专利> THERMAL ANALYSIS METHOD AND EQUIPMENT IN REFLOW COMPONENT MOUNTING, AND REFLOW EQUIPMENT

THERMAL ANALYSIS METHOD AND EQUIPMENT IN REFLOW COMPONENT MOUNTING, AND REFLOW EQUIPMENT

机译:回流组件安装的热分析方法和设备以及回流设备

摘要

PROBLEM TO BE SOLVED: To provide a thermal analysis method capable of rationalizing the conditions of a heating means for melting a bonding material and the conditions of a cooling means for removing thermal energy being transmitted from the heating means to a low heat resistance component efficiently with high accuracy at the time of reflow mounting of the low heat resistance component on a substrate.;SOLUTION: Component mounting data, component characteristics data and material data are combined to create a substrate model. At least two combinations are selected from a plurality of heating means and cooling means having different characteristics to create a plurality of process basic models. Subsequently, a plurality of substrate analysis models are created from the substrate model and respective process basic models, and thermal analysis processing is carried out simultaneously for respective substrate analysis models by experimental planning method thus rationalizing the heating means and the cooling means.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种热分析方法,该方法能够合理地合理化用于熔化结合材料的加热装置的条件和用于有效地去除从加热装置传递到低耐热成分的热能的冷却装置的条件。低耐热性组件在基板上回流安装时的高精度;解决方案:组合组件安装数据,组件特性数据和材料数据以创建基板模型。从具有不同特性的多个加热装置和冷却装置中选择至少两个组合以创建多个处理基本模型。随后,从基板模型和各自的处理基本模型创建多个基板分析模型,并通过实验计划方法同时对各个基板分析模型进行热分析处理,从而使加热装置和冷却装置合理化。 (C)2005,日本特许厅

著录项

  • 公开/公告号JP2005166795A

    专利类型

  • 公开/公告日2005-06-23

    原文格式PDF

  • 申请/专利权人 MATSUSHITA ELECTRIC IND CO LTD;

    申请/专利号JP20030401440

  • 发明设计人 FUJIWARA HIROAKI;IWASE TEPPEI;

    申请日2003-12-01

  • 分类号H05K3/34;

  • 国家 JP

  • 入库时间 2022-08-21 22:34:24

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