首页> 外国专利> COMPOUND MICROSCOPE EQUIPPED WITH PROBE, METHOD OF CALCULATING HEIGHT OF PROBE, AND METHOD OF DRIVING PROBE

COMPOUND MICROSCOPE EQUIPPED WITH PROBE, METHOD OF CALCULATING HEIGHT OF PROBE, AND METHOD OF DRIVING PROBE

机译:装有探针的复合显微镜,计算探针高度的方法和驱动探针的方法

摘要

PROBLEM TO BE SOLVED: To acquire a distance from a probe to a test sample, to drive the probe at a optimal probe speed proportional to the distance, and to stop driving the probe when the distance from the probe to the test sample becomes zero.;SOLUTION: A compound microscope equipped with a probe comprises: a stage on which two or more microscopes 1, 2 that allow observation of substantially the same point of a test sample and a test sample 6 are placed; a mechanical probe 3 for bringing the microscopes closer to or into contact with the test sample; a driving mechanism 14 for driving the mechanical probe; a measurement processing unit 10 for measuring an apparent distance from the test sample to the probe from images acquired from the two or more microscopes; and a measured data processing unit 12 for calculating an actual distance from the test sample to the probe based on two or more measured values and posture information (θ) of the microscopes, thereby accurately grasping the distance from the test sample to the probe.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:要解决的问题:获取从探头到测试样品的距离,以与该距离成比例的最佳探头速度驱动探头,并在从探头到测试样品的距离变为零时停止驱动探头。 ;解决方案:配备有探针的复合显微镜包括:在其上放置两个或多个显微镜1、2的平台,该显微镜可以观察试样和试样6的大致相同的位置;机械探针3,用于使显微镜更接近或接触测试样品;用于驱动机械探针的驱动机构14;测量处理单元10,用于根据从两个以上的显微镜获得的图像来测量从试样到探针的表观距离。测量数据处理单元12,用于基于两个或更多个显微镜的测量值和姿态信息(θ)来计算从测试样品到探针的实际距离,从而准确地掌握从测试样品到探针的距离。 ;版权:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP2005167146A

    专利类型

  • 公开/公告日2005-06-23

    原文格式PDF

  • 申请/专利权人 HITACHI HIGH-TECHNOLOGIES CORP;

    申请/专利号JP20030407615

  • 发明设计人 OONAMI YUSUKE;KANEOKA NORIYUKI;

    申请日2003-12-05

  • 分类号H01L21/66;G01B21/16;H01J37/28;H01J37/31;

  • 国家 JP

  • 入库时间 2022-08-21 22:34:17

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