首页> 外国专利> REFLECTIVE CHARACTERISTIC MEASURING APPARATUS, HIGH COLOR REPRODUCTION DESIGN SYSTEM USING IT, AND REFLECTIVE CHARACTERISTIC MEASURING METHOD

REFLECTIVE CHARACTERISTIC MEASURING APPARATUS, HIGH COLOR REPRODUCTION DESIGN SYSTEM USING IT, AND REFLECTIVE CHARACTERISTIC MEASURING METHOD

机译:反射特性测量装置,使用它的高色彩复制设计系统以及反射特性测量方法

摘要

PROBLEM TO BE SOLVED: To measure deflection reflection characteristics of an object accurately in a short time.;SOLUTION: In a coloring material malti-spectrum image acquisition part 10, an illumination source 20 is cast on the coloring material 18 as a measuring object having a uniform reflection characteristic in a specific range, the image of multi-band with different spectrum sensitivity characteristics is photographed with an obtainable multi-band camera. In a reflection characteristic operation part 12, the deflection reflection characteristics in the specified range of the coloring material 18 are calculated using the image signal of the multi-band image obtained with the coloring material multi-spectrum image acquisition part 10.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:为了在短时间内准确地测量物体的偏转反射特性;解决方案:在着色材料多光谱图像获取部件10中,将照明光源20投射在作为测量对象的着色材料18上。如果在特定范围内具有均匀的反射特性,则可以使用可获得的多波段相机拍摄具有不同光谱灵敏度特性的多波段图像。在反射特性运算部12中,使用由色料多光谱图像获取部10获得的多波段图像的图像信号,计算出色料18的规定范围内的偏转反射特性。 C)2005,日本特许厅

著录项

  • 公开/公告号JP2005181038A

    专利类型

  • 公开/公告日2005-07-07

    原文格式PDF

  • 申请/专利权人 OLYMPUS CORP;

    申请/专利号JP20030420572

  • 发明设计人 AJITO TAKEYUKI;KOMIYA YASUHIRO;

    申请日2003-12-18

  • 分类号G01J3/46;G06T15/50;

  • 国家 JP

  • 入库时间 2022-08-21 22:30:36

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号