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Capacitive coupling probe, signal acquisition method and test system

机译:电容耦合探头,信号采集方法和测试系统

摘要

PURPOSE: To realize highly accurate noncontact capturing of the signal in a circuit up to a high frequency by constituting a capacitive coupling probe of a probe chip, a probe body coupled mechanically therewith, and an amplifier arranged therein. ;CONSTITUTION: The probe 102 comprises a probe body 108, and a probe chip 104 having inner and outer conductors (or shield) 306, 308 arranged coaxially. At the detection end 310 of the chip 104, the conductor 306 detects an electric signal from an objective trace or a circuit conductor (e.g. an I/O pin 304) through capacitive coupling. The detection signal is amplified by a buffer/ amplifier 106 in a body 108 disposed closely to the chip 104 and can be observed directly on an oscilloscope, a strain gauge or a spectrum analyzer or it can be fed to a reproduction circuit 110.;COPYRIGHT: (C)1993,JPO
机译:用途:通过构成探针芯片的电容耦合探针,与其机械耦合的探针主体以及布置在其中的放大器,以实现在高达高频的电路中信号的高精度非接触捕获。组成:探针102包括探针主体108和探针芯片104,探针芯片104具有同轴布置的内导体和外导体(或屏蔽)306、308。在芯片104的检测端310,导体306通过电容耦合从目标迹线或电路导体(例如,I / O引脚304)检测电信号。检测信号由位于靠近芯片104的主体108中的缓冲器/放大器106放大,可以直接在示波器,应变仪或频谱分析仪上观察到,也可以馈送到再现电路110。 :(C)1993,日本特许厅

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