首页> 外国专利> Measurement system and moire method for measuring the distortion of the optical imaging system

Measurement system and moire method for measuring the distortion of the optical imaging system

机译:用于测量光学成像系统的畸变的测量系统和莫尔条纹方法

摘要

Providing a measurement system and the corresponding moiré how to be able to measure with measurement accuracy and high speed image distortion different directions present invention relates more. In the measurement system and moiré method for measuring aberrations of [SOLUTION] optical imaging system, to place the object grating with an object pattern in an object plane of the imaging system. I want to place the image grating having an image pattern on the image plane of the image forming system. Each have a large number of cells provided with a small grid of the grid different characteristics, it is projected to the image pattern on by the image forming system the object pattern, and the image of the small grid of the object pattern, image and pattern object pattern each are overlapped at least partially in the small grid pattern corresponding to the image, to produce a moire pattern small accordingly, and adapt to each other the image pattern and the pattern object. I detect a small moire pattern. I will evaluate the moire pattern small.
机译:提供一种测量系统和相应的莫尔条纹,其如何能够以测量精度和高速图像失真进行不同方向的测量,本发明进一步涉及。在用于测量[解决方案]光学成像系统的像差的测量系统和莫尔条纹方法中,将具有目标图案的目标光栅放置在成像系统的目标平面中。我想将具有图像图案的图像光栅放置在图像形成系统的图像平面上。每个都有大量的单元格,这些单元格提供具有不同特性的小网格,它通过图像形成系统投影到图像图案上的对象图案,以及小网格图像上的对象图案,图像和图案物体图案各自在与图像相对应的小网格图案中至少部分地重叠,以产生相应较小的莫尔图案,并且使图像图案和图案物体彼此适应。我检测到一条小的云纹图案。我将对波纹模式进行评估。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号