OMNIDIRECTIONAL EDDY CURRENT PROBES, ARRAY PROBES, AND INSPECTION SYSTEMS

摘要

PROBLEM TO BE SOLVED: To provide an improved eddy current probe, array probe, and inspection system that overcomes the problems associated with compensation for the directionality of conventional eddy current probes.;SOLUTION: The omnidirectional eddy current probe (600) includes a number of sense coils (110), arranged in a stack (112) having a principal axis (114). At least two of the sense coils (110) are rotationally skewed about the principal axis (114) relative to each another. The sense coils (110) are operatively connected to each other, and a drive coil (120) is also positioned in the stack (112). An impulse passing through the drive coil (120) induces magnetic influx through a conducting material specimen (12) having a surface (14), thereby generating eddy currents on the surface (14). A secondary magnetic flux, generated from the eddy currents, produces signals corresponding to the sense coils (110), and the signals are then analyzed for the possibility of surface flaw in the conducting material (12).;COPYRIGHT: (C)2005,JPO&NCIPI