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Memory cells not affected by the heavy ion collisions

机译:不受严重离子碰撞影响的存储单元

摘要

(57) Abstract The differential memory electrolysis cell, respectively, includes with high supply voltage and low the 1st P channel transistor and the 2nd N channel transistor and the 3rd N channel transistor which is in series jointed between supply voltage, two sets are had. The gate of one N channel transistor of each set is jointed to the output node of set of another side. The gate of the other N channel transistor of each set is jointed to the gate of the 1st transistor of the same set. The 4th P channel transistor is joined by each set, is jointed between the gates of the 1st transistor of high tension and aforementioned set. The 5th P channel transistor is joined by each set, the gate of the 1st transistor of aforementioned set reads and/the writing belt or is jointed between voltage low.
机译:(57)<摘要>差分存储电解池分别包括高供电电压和低供电电压的第一P沟道晶体管和第二N沟道晶体管和第三N沟道晶体管,它们串联连接在供电电压之间,两组是有。每组一个N沟道晶体管的栅极连接到另一侧的组的输出节点。每组的另一个N沟道晶体管的栅极接合到同一组的第一晶体管的栅极。第四P沟道晶体管每组接合,接合在高张力的第一晶体管的栅极与上述组之间。第五组P沟道晶体管被各组接合,上述组中的第一组晶体管的栅极被读出和/或写入带,或者被接合在低电压之间。

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