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Solid surface adsorption evaluation method of pollutants

机译:污染物的固体表面吸附评价方法

摘要

PROBLEM TO BE SOLVED: To provide a solid surface adsorption evaluating method for a contaminant allowing easy handling in pretreatment and easy evaluation, preventing a test piece from pollution in conveyance and storage, and dispensing with large equipment required conventionally in spite of usage a wafer itself for performing precise measurement and evaluation.;SOLUTION: In formation of the test piece made of the same material as a workpiece, the size of the test piece is set to allow its storage in an adsorption tube container mountable on a gas chromatograph mass spectrometer. The test piece is collected after it is left in a measured point in the atmosphere inside a clean room for a predetermined time. The collected test piece is introduced into the gas chromatograph mass spectrometer (GC-MS device), and material and mass of the contaminant is measured for evaluating a degree of pollution in the measured point.;COPYRIGHT: (C)2001,JPO
机译:要解决的问题:提供一种用于污染物的固体表面吸附评估方法,该方法能够轻松进行预处理和评估,防止试件在运输和存储过程中受到污染,并且即使使用晶片本身也可以分配常规所需的大型设备解决方案:在形成由与工件相同的材料制成的试件时,应将试件的尺寸设置为允许将其存储在可安装在气相色谱质谱仪上的吸附管容器中。将测试片在洁净室内的大气中的测量点放置预定时间后,将其收集。将收集的试件引入气相色谱质谱仪(GC-MS装置)中,并测量污染物的材料和质量,以评估测量点的污染程度。;版权所有:(C)2001,日本特许厅

著录项

  • 公开/公告号JP3632748B2

    专利类型

  • 公开/公告日2005-03-23

    原文格式PDF

  • 申请/专利权人 日立プラント建設株式会社;

    申请/专利号JP20000078650

  • 发明设计人 石割 修一;加藤 治夫;

    申请日2000-03-21

  • 分类号G01N27/62;G01N1/00;G01N1/02;

  • 国家 JP

  • 入库时间 2022-08-21 22:27:04

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