Noise immunity evaluation apparatus and noise immunity evaluation method

摘要

PROBLEM TO BE SOLVED: To conduct precise noise immunity evaluation about a semiconductor integrated circuit device provided with a decoupling capacity in an electric power source line, without requiring a high-frequency signal source of high power.;SOLUTION: This device/method is provided with the semiconductor integrated circuit device 1 as a measured sample, wiring 2 as the first wiring, the decoupling capacity 3 as the first capacity means, wiring 4 as the second wiring, a decoupling inductor 5, an electric power source 6, the decoupling capacity 37 as the second capacity means, a coaxial cable 8, an impedance matching resistance 9 of a signal line 10, the signal line 10, a cable 11, a display 12, a detection probe 13 as a detecting means, a coaxial cable 14, a level meter 15, a detection probe 16 as a detecting means, and a coaxial cable 17.;COPYRIGHT: (C)2004,JPO